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Measuring photoexcited electron and hole dynamics in ZnTe and modeling excited state core-valence effects in transient XUV reflection spectroscopy. (arXiv:2108.02262v1 [cond-mat.mtrl-sci]) http://arxiv.org/abs/2108.02262
Measuring photoexcited electron and hole dynamics in ZnTe and modeling excited state core-valence effects in transient XUV reflection spectroscopy. (arXiv:2108.02262v1 [cond-mat.mtrl-sci]) http://arxiv.org/abs/2108.02262