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Measurement of the Kerr nonlinear refractive index and its variation among 4H-SiC wafers. (arXiv:2211.09220v1 [physics.optics]) http://arxiv.org/abs/2211.09220
Measurement of the Kerr nonlinear refractive index and its variation among 4H-SiC wafers. (arXiv:2211.09220v1 [physics.optics]) http://arxiv.org/abs/2211.09220